Pinpointing chiral structures with front-back polarized neutron reflectometry.

Determination of the magnetic field penetration depth in YBa2Cu307-d superconducting films by polarized neutron reflectometry

Polarized neutron reflectometry was used for the direct measurement of the magnetic-field penetration depth in a high-temperature (HT,) superconducting film. Two scattering geometries were used. The deduced neutron scattering length density profile gave an exact picture of the composition of the film. The fit to the spin-asymmetry yielded a magnetic-penetration depth of 1400 2 100 A at a temper...

Hydrogen Absorption in Metal Thin Films and Heterostructures Investigated in Situ with Neutron and X-ray Scattering

Due to hydrogen possessing a relatively large neutron scattering length, hydrogen absorption and desorption behaviors in metal thin films can straightforwardly be investigated by neutron reflectometry. However, to further elucidate the chemical structure of the hydrogen absorbing materials, complementary techniques such as high resolution X-ray reflectometry and diffraction remain important too...

Application of polarized neutron reflectometry to studies of artificially structured magnetic materials

Detection of Multilayer Nano Structures by One Directional Polarization Analysis in Neutron Reflectometry

Submitted: Jul 16, 2013; Accepted: Aug 25, 2013; Published: Aug 29, 2013 Abstract: Due to the sensibility of neutron spin to the intrinsic magnetic field of magnetic materials, polarized neutron reflectometry is widely used in investigation of magnetic properties of nano-structures. Type and thickness of a multilayer can precisely be determined by measuring the polarization of reflected neutron...

Magnetometry and transport data complement polarized neutron reflectometry in magnetic depth profiling